Dissipated energy in tapping mode by the atomic force microscope

Gerson Andesron de Carvalho Lopes, Henrique Duarte da Fonseca Filho


Dissipated energy measurements between a tip of an AFM and a sample have been used to analyze variations in mechanical and tribological properties of materials, using tapping mode AFM to generate topography and phase contrast images. Furthermore it's possible to perform indentations in the material with this operation mode and to create micro-controlled defects, in diameter and depth, to growing of quantum dots in semiconductor materials. In this paper, we discuss the fundamentals of this technique.



Phase contrast; Plastic deformations; tip; nanoscale

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DOI: http://dx.doi.org/10.4025/actascitechnol.v37i4.27519

ISSN 1806-2563 (impresso) e ISSN 1807-8664 (on-line) e-mail: actatech@uem.br


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