<b>Dissipated energy in tapping mode by the atomic force microscope

Authors

  • Gerson Andesron de Carvalho Lopes Universidade Estadual do Amapá
  • Henrique Duarte da Fonseca Filho Universidade Federal do Amapá

DOI:

https://doi.org/10.4025/actascitechnol.v37i4.27519

Keywords:

phase contrast, plastic deformations, tip, nanoscale.

Abstract

Dissipated energy measurements between a tip of an AFM and a sample have been used to analyze variations in mechanical and tribological properties of materials, using tapping mode AFM to generate topography and phase contrast images. Furthermore it's possible to perform indentations in the material with this operation mode and to create micro-controlled defects, in diameter and depth, to growing of quantum dots in semiconductor materials. In this paper, we discuss the fundamentals of this technique.

 

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Author Biographies

Gerson Andesron de Carvalho Lopes, Universidade Estadual do Amapá

LABFIS, Universidade Estadual do AmapáAvenida Presidente Getúlio Vargas, número 650, Centro, CEP: 68.900-070, Macapá/AP

Henrique Duarte da Fonseca Filho, Universidade Federal do Amapá

Laboratório de Ciências dos Materiais, Departamento de Ciências Exatas e da Terra, Universidade Federal do Amapá, Rod. Juscelino Kubitschek de Oliveira, Km 02 - Bairro Zerão CEP 68902-280, Macapá - AP - Brazil

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Published

2015-10-01

How to Cite

Lopes, G. A. de C., & Fonseca Filho, H. D. da. (2015). <b>Dissipated energy in tapping mode by the atomic force microscope. Acta Scientiarum. Technology, 37(4), 403–409. https://doi.org/10.4025/actascitechnol.v37i4.27519

Issue

Vol. 37 No. 4 (2015)

Section

Physics

License

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